发明申请
- 专利标题: INSULATION MEASUREMENT APPARATUS
- 专利标题(中): 绝缘测量装置
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申请号: US13315684申请日: 2011-12-09
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公开(公告)号: US20120081135A1公开(公告)日: 2012-04-05
- 发明人: Yoshihiro KAWAMURA , Takafumi TSURUMI , Shintaro UCHIDA
- 申请人: Yoshihiro KAWAMURA , Takafumi TSURUMI , Shintaro UCHIDA
- 优先权: JPP2008-137050 20080526
- 主分类号: G01R27/08
- IPC分类号: G01R27/08
摘要:
An insulation measurement apparatus includes a path including a first resistor, a capacitor electrically floated from a ground, and a second resistor between a positive to a negative electrode side of a power supply, a first switching element between the power supply positive electrode side and the capacitor, a second switching element between the capacitor and the power supply negative electrode side, a detection section detecting a charge voltage on the capacitor and determining a power supply insulation state, and a voltage setting section executing a power supply voltage measurement mode controlling the first and second switching elements to charge the capacitor for a predetermined time period, and an insulation voltage measurement mode charging a terminal of a positive or negative electrode side of the capacitor via a resistor between the power supply positive or negative electrode and the ground for a predetermined time period.
公开/授权文献
- US08760172B2 Insulation measurement apparatus 公开/授权日:2014-06-24
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