发明申请
- 专利标题: INSPECTION SYSTEM AND METHOD FOR FAST CHANGES OF FOCUS
- 专利标题(中): 检验系统和方法快速变化
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申请号: US13224096申请日: 2011-09-01
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公开(公告)号: US20120086937A1公开(公告)日: 2012-04-12
- 发明人: Haim Feldman , Boris Morgenstein , Roman Naidis , Adam Baer
- 申请人: Haim Feldman , Boris Morgenstein , Roman Naidis , Adam Baer
- 主分类号: G01N21/88
- IPC分类号: G01N21/88 ; G02F1/33 ; G02F1/29
摘要:
An inspection system includes a first focusing unit configured to perform fast focus changes to a first focusing function applied to an incident light beam. A traveling lens acousto-optic device is arranged to receive the light beam focused by the first focusing function and produce focused spots using a plurality of traveling lenses generated in response to radio frequency signals. The traveling lenses apply a second focusing function and the traveling lens acousto-optic device is arranged to alter the second focusing function at a fast rate. The inspection system also includes optics arranged to direct the focused spots onto an inspected object and to direct radiation from the inspected object to a sensor.
公开/授权文献
- US08488117B2 Inspection system and method for fast changes of focus 公开/授权日:2013-07-16
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