发明申请
US20120088410A1 CONNECTOR AND SEMICONDUCTOR TESTING DEVICE INCLUDING THE CONNECTOR
有权
连接器和半导体测试装置，包括连接器
- 专利标题： CONNECTOR AND SEMICONDUCTOR TESTING DEVICE INCLUDING THE CONNECTOR
- 专利标题（中）： 连接器和半导体测试装置，包括连接器
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申请号： US13378007申请日： 2010-06-30
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公开(公告)号： US20120088410A1公开(公告)日： 2012-04-12
- 发明人: Kyoko Oniyama , Akinori Mizumura , Shin Sakiyama , Hiroyuki Hama , Hiromitsu Takasu
- 申请人： Kyoko Oniyama , Akinori Mizumura , Shin Sakiyama , Hiroyuki Hama , Hiromitsu Takasu
- 申请人地址： JP TOKYO JP KANAGAWA
- 专利权人： ADVANTEST CORPORATION,MOLEX JAPAN CO., LTD
- 当前专利权人： ADVANTEST CORPORATION,MOLEX JAPAN CO., LTD
- 当前专利权人地址： JP TOKYO JP KANAGAWA
- 优先权： JP2009-156360 20090630
- 国际申请： PCT/US10/40526 WO 20100630
- 主分类号： H01R24/28
- IPC分类号： H01R24/28
摘要：
Each of the signal terminal and the ground terminal includes a first extending portion extending toward its tip end, and a second extending portion extending in a direction opposite to the first extending portion. The first extending portion is formed such that a width thereof is smaller than a width of the second extending portion. The housing includes a first housing into which the first extending portions are inserted, and a second housing into which the second extending portions are inserted. The second housing is formed separately from the first housing, and the first housing includes a wall portion located between the first extending portion of the signal terminal and the first extending portion of the ground terminal.