- 专利标题: PROCESSOR TESTING
-
申请号: US12908370申请日: 2010-10-20
-
公开(公告)号: US20120102302A1公开(公告)日: 2012-04-26
- 发明人: Abhishek Bansal , Nitin P. Gupta , Brad L. Herold , Jayakumar N. Sankarannair
- 申请人: Abhishek Bansal , Nitin P. Gupta , Brad L. Herold , Jayakumar N. Sankarannair
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F9/38
- IPC分类号: G06F9/38
摘要:
Processors may be tested according to various implementations. In one general implementation, a process for processor testing may include randomly generating a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may also include randomly generating a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may additionally include generating a plurality of instructions to increment a counter when each branch instruction is encountered during execution.
公开/授权文献
- US08812826B2 Processor testing 公开/授权日:2014-08-19
信息查询