Invention Application
US20120105587A1 METHOD AND APPARATUS OF MEASURING DEPTH INFORMATION FOR 3D CAMERA
有权
测量3D摄像机深度信息的方法和装置
- Patent Title: METHOD AND APPARATUS OF MEASURING DEPTH INFORMATION FOR 3D CAMERA
- Patent Title (中): 测量3D摄像机深度信息的方法和装置
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Application No.: US13184489Application Date: 2011-07-15
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Publication No.: US20120105587A1Publication Date: 2012-05-03
- Inventor: Jun Haeng LEE , Hyun Surk Ryu , Keun Joo Park , Chang Woo Shin
- Applicant: Jun Haeng LEE , Hyun Surk Ryu , Keun Joo Park , Chang Woo Shin
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2010-0107646 20101101
- Main IPC: H04N13/02
- IPC: H04N13/02

Abstract:
Provided is a depth information measuring method and apparatus for a three-dimensional (3D) camera. The depth information measuring method and apparatus may output, to an object, an optical pulse of which an intensity is higher than an intensity of an ambient light. The depth information measuring method and apparatus may generate a voltage that is proportional to a log value of an intensity of a light reflected from the object. The depth information measuring method and apparatus may use discharging units, and the discharging units may respectively include dischargers having different discharging speeds or capacitors having different capacities.
Public/Granted literature
- US09237333B2 Method and apparatus of measuring depth information for 3D camera Public/Granted day:2016-01-12
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