Invention Application
US20120110398A1 DATA ERROR CHECK CIRCUIT, DATA ERROR CHECK METHOD, DATA TRANSMISSION METHOD USING DATA ERROR CHECK FUNCTION, SEMICONDUCTOR MEMORY APPARATUS AND MEMORY SYSTEM USING DATA ERROR CHECK FUNCTION 失效
数据错误检查电路,数据错误检查方法,使用数据错误检查功能的数据传输方法,使用数据错误检查功能的半导体存储器和存储器系统

  • Patent Title: DATA ERROR CHECK CIRCUIT, DATA ERROR CHECK METHOD, DATA TRANSMISSION METHOD USING DATA ERROR CHECK FUNCTION, SEMICONDUCTOR MEMORY APPARATUS AND MEMORY SYSTEM USING DATA ERROR CHECK FUNCTION
  • Patent Title (中): 数据错误检查电路,数据错误检查方法,使用数据错误检查功能的数据传输方法,使用数据错误检查功能的半导体存储器和存储器系统
  • Application No.: US12970869
    Application Date: 2010-12-16
  • Publication No.: US20120110398A1
    Publication Date: 2012-05-03
  • Inventor: Joong Ho LEE
  • Applicant: Joong Ho LEE
  • Applicant Address: KR Ichon-shi
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Ichon-shi
  • Priority: KR10-2010-0106861 20101029
  • Main IPC: G11C29/04
  • IPC: G11C29/04 G06F11/22
DATA ERROR CHECK CIRCUIT, DATA ERROR CHECK METHOD, DATA TRANSMISSION METHOD USING DATA ERROR CHECK FUNCTION, SEMICONDUCTOR MEMORY APPARATUS AND MEMORY SYSTEM USING DATA ERROR CHECK FUNCTION
Abstract:
Various embodiments of a memory system are disclosed. In one exemplary embodiment, the memory system may include a semiconductor memory apparatus configured to generate error check signals in a column direction and a row direction of data groups to be transmitted through a plurality of data input/output terminals in a read operation and output the error check signals together with the data groups, and a memory controller configured to control data read/write operations of the semiconductor memory apparatus, generate error check signals by performing error check in a column direction and a row direction of data groups to be transmitted in a write operation, and provide the error check signals to the semiconductor memory apparatus together with the data groups.
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