发明申请
- 专利标题: Autonomic Hotspot Profiling Using Paired Performance Sampling
- 专利标题(中): 使用配对性能采样的自动热点分析
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申请号: US12946959申请日: 2010-11-16
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公开(公告)号: US20120124560A1公开(公告)日: 2012-05-17
- 发明人: Venkat Rajeev Indukuru , Daniel Owen , Alexander Erik Mericas , John Fred Spannaus
- 申请人: Venkat Rajeev Indukuru , Daniel Owen , Alexander Erik Mericas , John Fred Spannaus
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F9/44
- IPC分类号: G06F9/44
摘要:
A processor performance profiler is enabled to for identify specific instructions causing performance issues within a program being executed by a microprocessor through random sampling to find the worst-case offenders of a particular event type such as a cache miss or a branch mis-prediction. Tracking all instructions causing a particular event generates large data logs, creates performance penalties, and makes code analysis more difficult. However, by identifying and tracking the worst offenders within a random sample of events without having to hash all events results in smaller memory requirements for the performance profiler, lower performance impact while profiling, and decreased complexity to analyze the program to identify major performance issues, which, in turn, enables better optimization of the program in shorter developer time.
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