发明申请
- 专利标题: LATERAL FLOW ASSAY SYSTEMS AND METHODS
- 专利标题(中): 侧流测量系统和方法
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申请号: US13360081申请日: 2012-01-27
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公开(公告)号: US20120129272A1公开(公告)日: 2012-05-24
- 发明人: Patrick T. Petruno , John F. Petrilla , Michael J. Brosnan , Rong Zhou , Daniel B. Roitman
- 申请人: Patrick T. Petruno , John F. Petrilla , Michael J. Brosnan , Rong Zhou , Daniel B. Roitman
- 申请人地址: US CA San Jose
- 专利权人: ALVERIX, INC.
- 当前专利权人: ALVERIX, INC.
- 当前专利权人地址: US CA San Jose
- 主分类号: G01N33/543
- IPC分类号: G01N33/543
摘要:
In one aspect, a diagnostic test system includes a housing, a reader, and a data analyzer. The housing includes a port for receiving a test strip. The reader obtains separable light intensity measurements from localized regions of an area of the detection zone exposed for optical inspection, wherein each of the localized regions is characterized by at least one surface dimension smaller than the first dimension. The data analyzer identifies ones of the light intensity measurements obtained from the at least one test region and computes at least one parameter from the identified ones of the light intensity measurements. In another aspect, the reader obtains a respective set of light intensity measurements from each of multiple corresponding regions of the exposed surface area of the detection zone, and the data analyzer computes at least one parameter from at least one of the sets of light intensity measurements.
公开/授权文献
- US09091631B2 Lateral flow assay systems and methods 公开/授权日:2015-07-28
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