发明申请
- 专利标题: SUBSTRATE PROCESSING METHOD
- 专利标题(中): 基板处理方法
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申请号: US13389288申请日: 2011-07-19
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公开(公告)号: US20120135608A1公开(公告)日: 2012-05-31
- 发明人: Hideki Shimoi , Keisuke Araki
- 申请人: Hideki Shimoi , Keisuke Araki
- 申请人地址: JP Hamamatsu-shi, Shizuoka
- 专利权人: Hamamatsu Photonics K.K.
- 当前专利权人: Hamamatsu Photonics K.K.
- 当前专利权人地址: JP Hamamatsu-shi, Shizuoka
- 优先权: JP2010-167430 20100726
- 国际申请: PCT/JP2011/066361 WO 20110719
- 主分类号: H01L21/306
- IPC分类号: H01L21/306
摘要:
A substrate processing method for forming a space extending along a predetermined line in a silicon substrate includes a first step of converging a laser light which is an elliptically-polarized light having an ellipticity other than 1 at the substrate so as to form a plurality of modified spots within the substrate along the line and construct a modified region including the modified spots, and a second step of anisotropically etching the substrate so as to advance an etching selectively along the modified region and form the space in the substrate. In the first step, the light is converged at the substrate such that a moving direction of the light with respect to the substrate and a direction of polarization of the light form an angle of less than 45° therebetween, and the modified spots are made align in a plurality of rows along the line.
公开/授权文献
- US08741777B2 Substrate processing method 公开/授权日:2014-06-03
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