发明申请
US20120141018A1 L1-Optimized AAM Alignment 有权
L1优化的AAM对准

  • 专利标题: L1-Optimized AAM Alignment
  • 专利标题(中): L1优化的AAM对准
  • 申请号: US12961347
    申请日: 2010-12-06
  • 公开(公告)号: US20120141018A1
    公开(公告)日: 2012-06-07
  • 发明人: Derek ShiellJing Xiao
  • 申请人: Derek ShiellJing Xiao
  • 主分类号: G06K9/62
  • IPC分类号: G06K9/62
L1-Optimized AAM Alignment
摘要:
An Active Appearance Model, AAM, uses an L1 minimization-based approach to aligning an input test image. In each iterative application of its statistical model fitting function, a shape parameter coefficient p and an appearance parameter coefficient λ within the statistical model fitting function are updated by L1 minimization. The AAM further includes a canonical classifier to determine if an aligned image is a true example of the class of object being sought before the AAM is permitted to output its aligned image.
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