发明申请
- 专利标题: L1-Optimized AAM Alignment
- 专利标题(中): L1优化的AAM对准
-
申请号: US12961347申请日: 2010-12-06
-
公开(公告)号: US20120141018A1公开(公告)日: 2012-06-07
- 发明人: Derek Shiell , Jing Xiao
- 申请人: Derek Shiell , Jing Xiao
- 主分类号: G06K9/62
- IPC分类号: G06K9/62
摘要:
An Active Appearance Model, AAM, uses an L1 minimization-based approach to aligning an input test image. In each iterative application of its statistical model fitting function, a shape parameter coefficient p and an appearance parameter coefficient λ within the statistical model fitting function are updated by L1 minimization. The AAM further includes a canonical classifier to determine if an aligned image is a true example of the class of object being sought before the AAM is permitted to output its aligned image.
公开/授权文献
- US08311319B2 L1-optimized AAM alignment 公开/授权日:2012-11-13
信息查询