发明申请
- 专利标题: DETECTING KEY CORRUPTION
- 专利标题(中): 检测关键的腐蚀
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申请号: US13325139申请日: 2011-12-14
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公开(公告)号: US20120148047A1公开(公告)日: 2012-06-14
- 发明人: Mark Trimmer
- 申请人: Mark Trimmer
- 申请人地址: GB Marlow
- 专利权人: STMicroelectronics (Research & Development) Limited
- 当前专利权人: STMicroelectronics (Research & Development) Limited
- 当前专利权人地址: GB Marlow
- 优先权: GB1021141.5 20101214
- 主分类号: H04L9/06
- IPC分类号: H04L9/06
摘要:
Corruption in a key stored in a memory is detected by reading a key from a key memory and determining if detection bits of the key read from the key memory correspond to an expected value. The expected value is a value of the detection bits of the key when the key is written to the key memory.
公开/授权文献
- US09069988B2 Detecting key corruption 公开/授权日:2015-06-30
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