发明申请
- 专利标题： METHOD OF DETERMINING ADEQUACY AND ADEQUACY DETERMINING DEVICE
- 专利标题（中）： 确定适应性和均匀性测定装置的方法
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申请号： US13329153申请日： 2011-12-16
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公开(公告)号： US20120154205A1公开(公告)日： 2012-06-21
- 发明人: Hideo Sasahara , Mikio Nagahara
- 申请人： Hideo Sasahara , Mikio Nagahara
- 申请人地址： JP Shinjuku-ku
- 专利权人： SEIKO EPSON CORPORATION
- 当前专利权人： SEIKO EPSON CORPORATION
- 当前专利权人地址： JP Shinjuku-ku
- 优先权： JP2010-281337 20101217
- 主分类号： G01S7/40
- IPC分类号： G01S7/40
摘要：
A method of determining adequacy of acquisition includes: attempting to acquire a satellite signal from a satellite and decoding first satellite orbit data; and determining the adequacy of acquisition of the satellite signal by using the first satellite orbit data and second satellite orbit data that has been acquired from the satellite.
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