Invention Application
- Patent Title: Thermal Inspection and Machining Systems and Methods of Use
- Patent Title (中): 热检查和加工系统及使用方法
-
Application No.: US12968308Application Date: 2010-12-15
-
Publication No.: US20120154570A1Publication Date: 2012-06-21
- Inventor: Ronald Scott Bunker , Jason Randolph Allen , Jared Crosby
- Applicant: Ronald Scott Bunker , Jason Randolph Allen , Jared Crosby
- Applicant Address: US NY Schnectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schnectady
- Main IPC: H04N7/18
- IPC: H04N7/18

Abstract:
The present application provides a thermal imaging and machining system for a machine component. The thermal imaging and machining system may include a machining subsystem with a machining device for drilling one or more holes in the machine component and a thermal inspection subsystem positioned about the machining subsystem. The thermal inspection subsystem may include an imager and one or more fluid supply lines such that a thermal response of the holes in the machine component may be determined.
Public/Granted literature
- US08810644B2 Thermal inspection and machining systems and methods of use Public/Granted day:2014-08-19
Information query