发明申请
- 专利标题: SAMPLE ANALYZING CHIP AND MEASUREMENT SYSTEM USING SAME
- 专利标题(中): 样品分析芯片和使用相同的测量系统
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申请号: US13379696申请日: 2010-06-15
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公开(公告)号: US20120156766A1公开(公告)日: 2012-06-21
- 发明人: Akiko Shiratori , Yoshiaki Yazawa , Takeshi Fujita , Kunio Harada , Kenko Uchida
- 申请人: Akiko Shiratori , Yoshiaki Yazawa , Takeshi Fujita , Kunio Harada , Kenko Uchida
- 优先权: JP2009-149294 20090624
- 国际申请: PCT/JP2010/060094 WO 20100615
- 主分类号: C12M1/40
- IPC分类号: C12M1/40 ; G01N21/76
摘要:
Temperature of a sensor chip itself rises with the supply of power owing to temperature dependence of the sensor chip as its basic characteristics. When a chemiluminescence reagent is added at the point of time at which the temperature rise reaches a steady state and a sensor chip photodiode dark current becomes constant, a drastic shift occurs in the sensor chip temperature. Remarkable dispersion occurs at this time in the sensor chip photodiode dark current Variance (unstability) of the sensor chip photodiode dark current can be decreased by reducing the temperature fluctuation of the sensor chip to minimum by using an exothermal effect of a thermal diffusion medium.