发明申请
US20120160112A1 Local Printing Apparatus And Method 审中-公开
本地印刷设备及方法

Local Printing Apparatus And Method
摘要:
According to example embodiments, a printing apparatus includes a wafer delivery unit configured to move and support a wafer, an optical microscope configured to inspect the wafer, a pattern transfer unit configured to display a position of a defect on the wafer detected using the optical microscope.
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