Invention Application
- Patent Title: IMAGE PROCESSING SYSTEM WITH ON-CHIP TEST MODE FOR COLUMN ADCS
- Patent Title (中): 具有片上测试模式的图像处理系统
-
Application No.: US12981970Application Date: 2010-12-30
-
Publication No.: US20120169909A1Publication Date: 2012-07-05
- Inventor: Jeff RYSINSKI , Yibing Michelle Wang , Sang-Soo Lee
- Applicant: Jeff RYSINSKI , Yibing Michelle Wang , Sang-Soo Lee
- Main IPC: H04N5/335
- IPC: H04N5/335

Abstract:
An image processing system includes a pixel array including a plurality of regular pixel columns and at least one test pixel column, a plurality of column analog-to-digital converters (ADCs) configured to correspond to the regular pixel columns and convert analog input signals into digital signals, and a switching block configured to provide output signals of the regular pixel columns to input ends of the corresponding column ADCs in a normal mode, and provide in common an output signal of the test pixel column to the input ends of the column ADCs in a test mode, wherein the test pixel column generates signals having a minute voltage different from one row to another row.
Public/Granted literature
- US08823850B2 Image processing system with on-chip test mode for column ADCs Public/Granted day:2014-09-02
Information query