发明申请
- 专利标题: Systems and Methods for Viewing and Analyzing Anatomical Structures
- 专利标题(中): 观察和分析解剖结构的系统和方法
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申请号: US13363753申请日: 2012-02-01
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公开(公告)号: US20120172700A1公开(公告)日: 2012-07-05
- 发明人: Arun Krishnan , Marcos Salganicoff , Xiang Sean Zhou , Venkat Raghavan Ramamurthy , Luca Bogoni , Gerardo Hermosillo Valadez
- 申请人: Arun Krishnan , Marcos Salganicoff , Xiang Sean Zhou , Venkat Raghavan Ramamurthy , Luca Bogoni , Gerardo Hermosillo Valadez
- 申请人地址: US PA Malvern
- 专利权人: SIEMENS MEDICAL SOLUTIONS USA, INC.
- 当前专利权人: SIEMENS MEDICAL SOLUTIONS USA, INC.
- 当前专利权人地址: US PA Malvern
- 主分类号: A61B6/00
- IPC分类号: A61B6/00 ; G09G5/00
摘要:
Systems and methods for supporting a diagnostic workflow from a computer system are disclosed herein. In accordance with one implementation, a set of pre-identified anatomical landmarks associated with one or more structures of interest within one or more medical images are presented to a user. In response to a user input selecting at least one or more regions of interest including one or more of the pre-identified anatomical landmarks, the user is automatically navigated to the selected region of interest. In another implementation, a second user input selecting one or more measurement tools is received. An evaluation may be automatically determined based on one or more of the set of anatomical landmarks in response to the second user input.
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