发明申请
US20120182415A1 Pattern Matching Method, Pattern Matching Program, Electronic Computer, and Electronic Device Testing Apparatus
审中-公开
模式匹配方法，模式匹配程序，电子计算机和电子设备测试仪器
- 专利标题： Pattern Matching Method, Pattern Matching Program, Electronic Computer, and Electronic Device Testing Apparatus
- 专利标题（中）： 模式匹配方法，模式匹配程序，电子计算机和电子设备测试仪器
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申请号： US13499983申请日： 2010-10-04
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公开(公告)号： US20120182415A1公开(公告)日： 2012-07-19
- 发明人: Yasutaka Toyoda , Mitsuji Ikeda , Yuichi Abe
- 申请人： Yasutaka Toyoda , Mitsuji Ikeda , Yuichi Abe
- 申请人地址： JP Minato-ku, Tokyo
- 专利权人： Hitachi High-Technologies Corporation
- 当前专利权人： Hitachi High-Technologies Corporation
- 当前专利权人地址： JP Minato-ku, Tokyo
- 优先权： JP2009-231428 20091005
- 国际申请： PCT/JP2010/067364 WO 20101004
- 主分类号： H04N7/18
- IPC分类号： H04N7/18
摘要：
Disclosed is a pattern matching method whereby a testing point can be searched accurately while simplifying the work of presetting. An image region of a part of a captured image is extracted, and a divided image of the image region is set as a template image. A pattern matching is performed by rotating the template image. Moreover, the pattern matching determines whether a point-symmetric pattern exists inside the image region.
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