发明申请
US20120182806A1 Memory Architecture of 3D Array With Alternating Memory String Orientation and String Select Structures
有权
具有交替内存字符串方向和字符串选择结构的3D阵列的内存架构
- 专利标题: Memory Architecture of 3D Array With Alternating Memory String Orientation and String Select Structures
- 专利标题(中): 具有交替内存字符串方向和字符串选择结构的3D阵列的内存架构
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申请号: US13078311申请日: 2011-04-01
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公开(公告)号: US20120182806A1公开(公告)日: 2012-07-19
- 发明人: Shih-Hung Chen , Hang-Ting Lue
- 申请人: Shih-Hung Chen , Hang-Ting Lue
- 申请人地址: TW Hsinchu
- 专利权人: Macronix International Co., Ltd.
- 当前专利权人: Macronix International Co., Ltd.
- 当前专利权人地址: TW Hsinchu
- 主分类号: G11C16/04
- IPC分类号: G11C16/04
摘要:
A 3D memory device includes a plurality of ridge-shaped stacks, in the form of multiple strips of conductive material separated by insulating material, arranged as bit lines which can be coupled through decoding circuits to sense amplifiers. Diodes are connected to the bit lines at either the string select of common source select ends of the strings. The strips of conductive material have side surfaces on the sides of the ridge-shaped stacks. A plurality of word lines, which can be coupled to row decoders, extends orthogonally over the plurality of ridge-shaped stacks. Memory elements lie in a multi-layer array of interface regions at cross-points between side surfaces of the semiconductor strips on the stacks and the word lines.
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