发明申请
US20120185200A1 ELECTRONIC DEVICE AND METHOD OF OPTIMIZING MEASUREMENT PATHS 有权
电子设备及优化测量方法

ELECTRONIC DEVICE AND METHOD OF OPTIMIZING MEASUREMENT PATHS
摘要:
A method of optimizing measurement paths analyzes one or more measurement points for each of the measurement elements of a product and generates relation arrays, each of the relation arrays storing the name and the one or more measurement points of one measurement element. The method selects a measurement point which is the nearest to the origin of an coordinate system of the product, computes distances between the measurement points from the selected measurement point using the relation arrays, and orders the measurement points according to the computed distances to generate a first ordered array. The method generates an optimal measurement path according to the first ordered array.
公开/授权文献
信息查询
0/0