发明申请
- 专利标题: ELECTRONIC DEVICE AND METHOD OF OPTIMIZING MEASUREMENT PATHS
- 专利标题(中): 电子设备及优化测量方法
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申请号: US13287135申请日: 2011-11-02
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公开(公告)号: US20120185200A1公开(公告)日: 2012-07-19
- 发明人: CHIH-KUANG CHANG , XIN-YUAN WU , GEN YANG
- 申请人: CHIH-KUANG CHANG , XIN-YUAN WU , GEN YANG
- 申请人地址: TW Tu-Cheng CN Shenzhen City
- 专利权人: HON HAI PRECISION INDUSTRY CO., LTD.,HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
- 当前专利权人: HON HAI PRECISION INDUSTRY CO., LTD.,HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
- 当前专利权人地址: TW Tu-Cheng CN Shenzhen City
- 优先权: CN201110020402.4 20110118
- 主分类号: G06F19/00
- IPC分类号: G06F19/00
摘要:
A method of optimizing measurement paths analyzes one or more measurement points for each of the measurement elements of a product and generates relation arrays, each of the relation arrays storing the name and the one or more measurement points of one measurement element. The method selects a measurement point which is the nearest to the origin of an coordinate system of the product, computes distances between the measurement points from the selected measurement point using the relation arrays, and orders the measurement points according to the computed distances to generate a first ordered array. The method generates an optimal measurement path according to the first ordered array.