发明申请
US20120185211A1 PARTICLE MEASURING APPARATUS AND MEASURING METHOD USING THE SAME 有权
颗粒测量装置和使用该方法的测量方法

PARTICLE MEASURING APPARATUS AND MEASURING METHOD USING THE SAME
摘要:
Provided are a particle measurement apparatus having a plurality of apertures arranged in series therein, and a particle measurement method using the same to statistically analyze multiple signals generated when a particle passes through the plurality of apertures, thus acquiring more accurate information on particles. The particle measurement apparatus includes a plurality of aperture members arranged in series, a plurality of electrodes to form an electric field within the plurality of aperture members, and an analyzer for statistically analyzing multiple electrical signals generated when a particle passes through the plurality of aperture members.
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