发明申请
US20120185221A1 SUITABILITY DETERMINATION METHOD FOR DETERMINATION STANDARD VALUE AND METHOD FOR SPECIFYING OPTIMUM VALUE THEREOF, INSPECTION SYSTEM FOR SUBSTRATE ON WHICH COMPONENTS ARE MOUNTED, SIMULATION METHOD AT PRODUCTION SITE, AND SIMULATION SYSTEM
审中-公开
用于确定标准值的适用性确定方法和指定其最佳值的方法，用于组件的安装的基板检查系统，生产现场的模拟方法和模拟系统
- 专利标题： SUITABILITY DETERMINATION METHOD FOR DETERMINATION STANDARD VALUE AND METHOD FOR SPECIFYING OPTIMUM VALUE THEREOF, INSPECTION SYSTEM FOR SUBSTRATE ON WHICH COMPONENTS ARE MOUNTED, SIMULATION METHOD AT PRODUCTION SITE, AND SIMULATION SYSTEM
- 专利标题（中）： 用于确定标准值的适用性确定方法和指定其最佳值的方法，用于组件的安装的基板检查系统，生产现场的模拟方法和模拟系统
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申请号： US13280627申请日： 2011-10-25
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公开(公告)号： US20120185221A1公开(公告)日： 2012-07-19
- 发明人: Hiroyuki Mori , Katsuki Nakajima , Hiroshi Tasaki
- 申请人： Hiroyuki Mori , Katsuki Nakajima , Hiroshi Tasaki
- 申请人地址： JP Kyoto
- 专利权人： OMRON CORPORATION
- 当前专利权人： OMRON CORPORATION
- 当前专利权人地址： JP Kyoto
- 优先权： JP2011-008267 20110118
- 主分类号： G06F17/10
- IPC分类号： G06F17/10 ; G06F19/00
摘要：
Suitability of determination standard value for intermediate inspection is determined. A correlation between measured values X for intermediate inspection and measured values Y for final inspection is derived. For each of calculation target points on X-axis, a distribution pattern of measured values Y is specified for measured value Xn of the point based on the correlation, and probabilities of a range determined to be non-defective by determination standard value of final inspection and a range determined to be defective that are included in the distribution are calculated. For each of the ranges of measured values X determined to be non-defective and defective based on the determination standard value of the intermediate inspection, a degree of consistency and a degree of inconsistency between results of inspections are determined using the probabilities. Suitability of the determination standard value is determined based on the two degrees.