发明申请
US20120190188A1 METHOD FOR FILLING A GAP 审中-公开
填充差距的方法

  • 专利标题: METHOD FOR FILLING A GAP
  • 专利标题(中): 填充差距的方法
  • 申请号: US13379967
    申请日: 2011-02-28
  • 公开(公告)号: US20120190188A1
    公开(公告)日: 2012-07-26
  • 发明人: Chao ZhaoWenwu WangHuicai Zhong
  • 申请人: Chao ZhaoWenwu WangHuicai Zhong
  • 优先权: CN201010590432.4 20101215
  • 国际申请: PCT/CN11/71360 WO 20110228
  • 主分类号: H01L21/768
  • IPC分类号: H01L21/768
METHOD FOR FILLING A GAP
摘要:
A method for filling a gap includes: providing a semiconductor substrate, at least having an metal interconnect layer and an insulating dielectric layer on top of the underlying metal interconnect layer, the insulating dielectric layer having a gap; forming a diffusion bather layer and a seed layer sequentially in the gap and on a surface of the insulating dielectric layer outside the gap; forming a mask layer on a surface of the seed layer outside of the gap; and depositing a metal layer on the semiconductor substrate with the mask layer, the metal layer filling the gap.
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