发明申请
- 专利标题: METHOD FOR FILLING A GAP
- 专利标题(中): 填充差距的方法
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申请号: US13379967申请日: 2011-02-28
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公开(公告)号: US20120190188A1公开(公告)日: 2012-07-26
- 发明人: Chao Zhao , Wenwu Wang , Huicai Zhong
- 申请人: Chao Zhao , Wenwu Wang , Huicai Zhong
- 优先权: CN201010590432.4 20101215
- 国际申请: PCT/CN11/71360 WO 20110228
- 主分类号: H01L21/768
- IPC分类号: H01L21/768
摘要:
A method for filling a gap includes: providing a semiconductor substrate, at least having an metal interconnect layer and an insulating dielectric layer on top of the underlying metal interconnect layer, the insulating dielectric layer having a gap; forming a diffusion bather layer and a seed layer sequentially in the gap and on a surface of the insulating dielectric layer outside the gap; forming a mask layer on a surface of the seed layer outside of the gap; and depositing a metal layer on the semiconductor substrate with the mask layer, the metal layer filling the gap.
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