发明申请
US20120212741A1 METHOD AND INSPECTION DEVICE FOR BRIGHT SPOT DEFECT DETECTION OF A POLARIZER 有权
一种偏光镜的明亮点缺陷检测方法和检测装置

  • 专利标题: METHOD AND INSPECTION DEVICE FOR BRIGHT SPOT DEFECT DETECTION OF A POLARIZER
  • 专利标题(中): 一种偏光镜的明亮点缺陷检测方法和检测装置
  • 申请号: US13214134
    申请日: 2011-08-19
  • 公开(公告)号: US20120212741A1
    公开(公告)日: 2012-08-23
  • 发明人: Shin-Min Chao
  • 申请人: Shin-Min Chao
  • 申请人地址: TW Taoyuan
  • 专利权人: BENQ MATERIALS CORP.
  • 当前专利权人: BENQ MATERIALS CORP.
  • 当前专利权人地址: TW Taoyuan
  • 优先权: TW100105777 20110222
  • 主分类号: G01J4/00
  • IPC分类号: G01J4/00
METHOD AND INSPECTION DEVICE FOR BRIGHT SPOT DEFECT DETECTION OF A POLARIZER
摘要:
A method of bright spot defect detection for a polarizer is to be performed by an inspection device and includes the steps of: a) obtaining gray values for pixels of an image of a detected region, that contains a target spot, on the polarizer; b) obtaining a gray value variation score from the gray values obtained for the detected region, the gray value variation score being indicative of gray value variation among the pixels of the image of the detected region; and c) comparing the gray value variation score obtained for the detected region with a threshold value to obtain a comparison result, and determining whether the target spot is a bright spot according to the comparison result.
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