发明申请
- 专利标题： AUTOMATED DEFECT CLASSIFICATION
- 专利标题（中）： 自动缺陷分类
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申请号： US13406620申请日： 2012-02-28
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公开(公告)号： US20120222007A1公开(公告)日： 2012-08-30
- 发明人: Corville O. Allen , Albert A. Chung , Binh C. Truong , Kam K. Yee
- 申请人： Corville O. Allen , Albert A. Chung , Binh C. Truong , Kam K. Yee
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 主分类号： G06F9/44
- IPC分类号： G06F9/44
摘要：
Embodiments of the present invention address deficiencies of the art in respect to defect classification for software development and provide a method, system and computer program product for automated defect classification in a software development tool. In an embodiment of the invention, a defect classification method can be provided. The method can include computing differences between versions of a line of source code, lexically analyzing the computed differences to produce a lexical construct, mapping the lexical construct to a classification, and assigning the defect classification to the line of source code.
公开/授权文献
- US08549465B2 Automated defect classification for program code 公开/授权日：2013-10-01
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