发明申请
- 专利标题: Variable Resistance Device, Semiconductor Device Including The Variable Resistance Device, And Method Of Operating The Semiconductor Device
- 专利标题(中): 可变电阻器件,包括可变电阻器件的半导体器件以及操作半导体器件的方法
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申请号: US13307672申请日: 2011-11-30
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公开(公告)号: US20120230080A1公开(公告)日: 2012-09-13
- 发明人: Man Chang , Young-bae Kim , Chang-jung Kim , Myoung-jae Lee , Seong-jun Park , Ji-hyun Hur , Dong-soo Lee , Chang-bum Lee , Seung-ryul Lee
- 申请人: Man Chang , Young-bae Kim , Chang-jung Kim , Myoung-jae Lee , Seong-jun Park , Ji-hyun Hur , Dong-soo Lee , Chang-bum Lee , Seung-ryul Lee
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2011-0021869 20110311
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
According to an example embodiment, a method of operating a semiconductor device includes applying a first voltage to the variable resistance device so as to change a resistance value of the variable resistance device from a first resistance value to a second resistance value that is different from the first resistance value, sensing first current flowing through the variable resistance device to which the first voltage is applied, determining a second voltage used to change the resistance value of the variable resistance device from the second resistance value to the first resistance value based on a distribution of the sensed first current, and applying the determined second voltage to the variable resistance device.
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