发明申请
US20120271824A1 Performance Curve Generation For Non-Destructive Testing Sensors
有权
非破坏性测试传感器的性能曲线生成
- 专利标题: Performance Curve Generation For Non-Destructive Testing Sensors
- 专利标题(中): 非破坏性测试传感器的性能曲线生成
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申请号: US13451128申请日: 2012-04-19
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公开(公告)号: US20120271824A1公开(公告)日: 2012-10-25
- 发明人: Neil J. Goldfine , Yanko K. Sheiretov , Floyd W. Spencer , David A. Jablonski , David C. Grundy , Darrell E. Schlicker
- 申请人: Neil J. Goldfine , Yanko K. Sheiretov , Floyd W. Spencer , David A. Jablonski , David C. Grundy , Darrell E. Schlicker
- 申请人地址: US MA Waltham
- 专利权人: JENTEK Sensors, Inc.
- 当前专利权人: JENTEK Sensors, Inc.
- 当前专利权人地址: US MA Waltham
- 主分类号: G01D21/00
- IPC分类号: G01D21/00 ; G06F17/30 ; G01N29/34 ; G06F17/18 ; G01N27/82
摘要:
Methods and apparatus for enhancing performance curve generation, damage monitoring, and improving non-destructive testing performance. Damage standards used for performance curve generation are monitored using a non-destructive testing (NDT) sensor during a damage evolution test performed with the standard. The evolution test may be intermittently paused to permit ground truth data to be collected in addition to the NDT sensor data. A damage evolution model may be used to estimate ground truth data during the intervening periods of the damage evolution test. The NDT sensor data and ground truth data are used to generate performance curves for the NDT system. Multiple sensors may be monitored at multiple locations on the damage standard and multiple damage evolution tests may be performed with multiple damage standards.
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