Invention Application
- Patent Title: RESOLUTION TEST DEVICE AND METHOD THEREOF
- Patent Title (中): 分辨率测试装置及其方法
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Application No.: US13197735Application Date: 2011-08-03
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Publication No.: US20120274788A1Publication Date: 2012-11-01
- Inventor: Ku-Nien Chang , Wen-Chun Chen
- Applicant: Ku-Nien Chang , Wen-Chun Chen
- Applicant Address: TW Hsinchu City
- Assignee: ALTEK CORPORATION
- Current Assignee: ALTEK CORPORATION
- Current Assignee Address: TW Hsinchu City
- Priority: TW100114684 20110427
- Main IPC: H04N17/00
- IPC: H04N17/00

Abstract:
A resolution test device and a method thereof are provided. The resolution test method is adapted for testing a resolution of a camera device. The resolution test method includes providing a graph to the camera device, capturing a test image shot by the camera device, shifting an analyzing window a specific distance in a first direction from a static area to a first area on the test image, analyzing the first area to generate a first high-pass element, shifting the analyzing window back to the static area, shifting the analyzing window the specific distance in a second direction from the static area to a second area on the test image, analyzing the second area to generate a second high-pass element, generating a third high-pass element according to the first and the second high-pass element, and defining the resolution of the camera device according to the third high-pass element.
Public/Granted literature
- US08363111B2 Resolution test device and method thereof Public/Granted day:2013-01-29
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