发明申请
- 专利标题: Single Crystal Ge On Si
- 专利标题(中): 单晶晶硅
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申请号: US13425079申请日: 2012-03-20
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公开(公告)号: US20120280276A1公开(公告)日: 2012-11-08
- 发明人: Rytis Dargis , Erdem Arkun , Andrew Clark , Michael Lebby
- 申请人: Rytis Dargis , Erdem Arkun , Andrew Clark , Michael Lebby
- 主分类号: H01L21/20
- IPC分类号: H01L21/20 ; H01L29/165
摘要:
A single crystal germanium-on-silicon structure includes a single crystal silicon substrate. A single crystal layer of gadolinium oxide is epitaxially grown on the substrate. The gadolinium oxide has a cubic crystal structure and a lattice spacing approximately equal to the lattice spacing or a multiple of the single crystal silicon. A single crystal layer of lanthanum oxide is epitaxially grown on the gadolinium oxide with a thickness of approximately 12 nm or less. The lanthanum oxide has a lattice spacing approximately equal to the lattice spacing or a multiple of single crystal germanium and a cubic crystal structure approximately similar to the cubic crystal structure of the gadolinium oxide. A single crystal layer of germanium with a (111) crystal orientation is epitaxially grown on the layer of lanthanum oxide.
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