发明申请
US20120282762A1 Method For Forming Gallium Nitride Semiconductor Device With Improved Forward Conduction
有权
用于形成具有改进的正向传导的氮化镓半导体器件的方法
- 专利标题: Method For Forming Gallium Nitride Semiconductor Device With Improved Forward Conduction
- 专利标题(中): 用于形成具有改进的正向传导的氮化镓半导体器件的方法
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申请号: US13553237申请日: 2012-07-19
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公开(公告)号: US20120282762A1公开(公告)日: 2012-11-08
- 发明人: TingGang Zhu
- 申请人: TingGang Zhu
- 申请人地址: US CA Sunnyvale
- 专利权人: ALPHA & OMEGA SEMICONDUCTOR, INC.
- 当前专利权人: ALPHA & OMEGA SEMICONDUCTOR, INC.
- 当前专利权人地址: US CA Sunnyvale
- 主分类号: H01L21/329
- IPC分类号: H01L21/329 ; H01L21/20
摘要:
A method for forming a gallium nitride based semiconductor diode includes forming Schottky contacts on the upper surface of mesas formed in a semiconductor body formed on a substrate. Ohmic contacts are formed on the lower surface of the semiconductor body. In one embodiment, an insulating layer is formed over the Schottky and ohmic contacts and vias are formed in the insulating layer to the Schottky and ohmic contacts to form the anode and cathode electrodes. In another embodiment, vias are formed in the insulating layer to the Schottky contacts and vias are formed in the semiconductor body to the ohmic contacts. An anode electrode is formed in electrical contact with the Schottky contacts. A cathode electrode is formed in electrical contact with the ohmic contacts on the backside of the substrate.
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