发明申请
- 专利标题: CHARGED PARTICLE INSTRUMENT
- 专利标题(中): 充电颗粒仪
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申请号: US13451596申请日: 2012-04-20
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公开(公告)号: US20120286160A1公开(公告)日: 2012-11-15
- 发明人: Takeyoshi OHASHI , Yasunari Sohda , Makoto Ezumi , Muneyuki Fukuda , Noritsugu Takahashi
- 申请人: Takeyoshi OHASHI , Yasunari Sohda , Makoto Ezumi , Muneyuki Fukuda , Noritsugu Takahashi
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 优先权: JP2011-103949 20110509
- 主分类号: H01J37/28
- IPC分类号: H01J37/28
摘要:
A charged particle instrument including a controlling and operating unit for controlling a charged particle source, deflecting means, and focus changing means and making a data for an image by an electric signal detected by a detector, and a recording unit for preserving a correction coefficient registered at each image-acquisition, in which the controlling and operating unit acquires plural images while changing a focus, and controls an optical condition such that a landing angle of a charged particle beam becomes perpendicular when an image for measurement is acquired on the basis of a position shift amount of a mark in the image and a correction coefficient registered to the recording unit.
公开/授权文献
- US09230775B2 Charged particle instrument 公开/授权日:2016-01-05
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