发明申请
US20120286815A1 Inspection Device Applying Probe Contact for Signal Transmission
审中-公开
检测装置应用探头触点进行信号传输
- 专利标题: Inspection Device Applying Probe Contact for Signal Transmission
- 专利标题(中): 检测装置应用探头触点进行信号传输
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申请号: US13243331申请日: 2011-09-23
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公开(公告)号: US20120286815A1公开(公告)日: 2012-11-15
- 发明人: Chian-Jung CHEN , Ching-Feng Hsieh
- 申请人: Chian-Jung CHEN , Ching-Feng Hsieh
- 申请人地址: TW New Taipei City
- 专利权人: Askey Computer Corporation
- 当前专利权人: Askey Computer Corporation
- 当前专利权人地址: TW New Taipei City
- 优先权: TW100116621 20110512
- 主分类号: G01R1/067
- IPC分类号: G01R1/067
摘要:
An inspection device applying probe contact for signal transmission includes an inspection panel board; a probe base disposed on the inspection panel board and having a plurality of probes; a receiving moldboard disposed on the inspection panel board and including a fillister for receiving inspected portable electronic apparatus, and an open slot allocated facing the plurality of probes of the probe base, thereby enabling the plurality of probes to contact with corresponding signal terminals of the portable electronic apparatus; and a clamp unit disposed on the inspection panel board and consisting of an adjustable rod and a clamp block allocated at one end of the adjustable rod, the adjustable rod adjusting position of the clamp block, thereby clamping and properly positioning the portable electronic apparatus in the receiving moldboard.
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