发明申请
- 专利标题: SEMICONDUCTOR DEVICE
- 专利标题(中): 半导体器件
-
申请号: US13477373申请日: 2012-05-22
-
公开(公告)号: US20120299006A1公开(公告)日: 2012-11-29
- 发明人: Hidekazu MIYAIRI , Atsushi HIROSE , Yoshitaka YAMAMOTO , Tomohiro KIMURA
- 申请人: Hidekazu MIYAIRI , Atsushi HIROSE , Yoshitaka YAMAMOTO , Tomohiro KIMURA
- 申请人地址: JP Osaka JP Atsugi-shi
- 专利权人: SHARP KABUSHIKI KAISHA,SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人: SHARP KABUSHIKI KAISHA,SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人地址: JP Osaka JP Atsugi-shi
- 优先权: JP2011-116175 20110524
- 主分类号: H01L27/06
- IPC分类号: H01L27/06
摘要:
An object is to prevent light leakage caused due to misregistration even when the width of a black matrix layer is not expanded to a designed value or larger. One embodiment of the present invention is a semiconductor device including a single-gate thin film transistor in which a first semiconductor layer is sandwiched between a bottom-gate electrode and a first black matrix layer. The first semiconductor layer and the first black matrix layer overlap with each other.
公开/授权文献
- US08772752B2 Semiconductor device 公开/授权日:2014-07-08
信息查询
IPC分类: