发明申请
- 专利标题: CALIBRATION APPARATUS FOR PROBES
- 专利标题(中): PROBES校准装置
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申请号: US13171460申请日: 2011-06-29
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公开(公告)号: US20120299574A1公开(公告)日: 2012-11-29
- 发明人: CHUANG-WEI TSENG , CHI-MIN WANG , CHIH-YU YEH , CHIA-MING YEH
- 申请人: CHUANG-WEI TSENG , CHI-MIN WANG , CHIH-YU YEH , CHIA-MING YEH
- 申请人地址: TW Tu-Cheng
- 专利权人: HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人: HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人地址: TW Tu-Cheng
- 优先权: TW100118034 20110523
- 主分类号: G01R35/04
- IPC分类号: G01R35/04
摘要:
An apparatus includes a connector and a connecting apparatus. The connector includes a first pin and a shell surrounding the first pin. The shell is insulated from the first pin. The connecting apparatus includes a main body, a second pin, and a third pin. The main body is connected to a bottom of the shell of the connector. First ends of the second and third pins extend through the main body, to be electrically connected to the first pin and the shell, respectively. Second ends of the second and third pins are exposed through a bottom of the main body.
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