发明申请
- 专利标题: Systems and Methods for Pattern Detection
- 专利标题(中): 模式检测系统与方法
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申请号: US13113210申请日: 2011-05-23
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公开(公告)号: US20120303327A1公开(公告)日: 2012-11-29
- 发明人: Xun Zhang , Mark D. Thornley , Viswanath Annampedu , Peter J. Windler
- 申请人: Xun Zhang , Mark D. Thornley , Viswanath Annampedu , Peter J. Windler
- 专利权人: LSI Corporation
- 当前专利权人: LSI Corporation
- 主分类号: G06F15/00
- IPC分类号: G06F15/00
摘要:
Various embodiments of the present invention provide systems and methods related to pattern detection. As an example, a system for sample selection is disclosed that includes a difference calculation circuit, a comparator circuit, and an output selector circuit. The difference calculation circuit is operable to calculate a first difference between a first value corresponding to a first digital sample and a second value corresponding to a second digital sample, and to calculate a second difference between a third value corresponding to a third digital sample and a fourth value corresponding to a fourth digital sample. The comparator circuit is operable to compare the first difference with the second difference to yield a comparison output. The output selector circuit is operable to select one of the second value and the fourth value as an output based at least upon the comparison output.
公开/授权文献
- US08874410B2 Systems and methods for pattern detection 公开/授权日:2014-10-28
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