发明申请
- 专利标题: FAILURE CAUSE DIAGNOSIS SYSTEM AND METHOD
- 专利标题(中): 故障原因诊断系统和方法
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申请号: US13578034申请日: 2010-02-26
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公开(公告)号: US20120310597A1公开(公告)日: 2012-12-06
- 发明人: Hiroki Uchiyama , Shinya Yuda , Hideaki Suzuki , Kozo Nakamura
- 申请人: Hiroki Uchiyama , Shinya Yuda , Hideaki Suzuki , Kozo Nakamura
- 国际申请: PCT/JP2010/001303 WO 20100226
- 主分类号: G06F15/00
- IPC分类号: G06F15/00
摘要:
Conditional base maintenance has been gaining widespread acceptance, with numerous sensors attached to equipment for constant monitoring of its operational state, the resulting sensor data being compared with those about the equipment in the normal state for a diagnosis to determine whether the equipment is currently operating normally, the result of the diagnosis being used to conduct maintenance. Conditional base maintenance can rapidly detect aging deterioration of the equipment, so that abnormal sates that were not detected before in time base maintenance can now be detected. However, although conventional diagnosis technology can distinguish between the normal state and anomaly, it has been difficult with such technology to identify causes including abnormal phenomena and parts. If it is determined that the target equipment to be diagnosed deviates from the normal state, the degree of deviation of each parameter from the normal state as the reference is calculated as an abnormal contribution ratio. A failure cause is estimated from a similarity ratio between the calculated abnormal contribution ratio and the abnormal contribution ratio of each of the failure causes collected in the past and including failure phenomena and failure parts.
公开/授权文献
- US09122273B2 Failure cause diagnosis system and method 公开/授权日:2015-09-01