发明申请
- 专利标题: Photon Measurement Method and Apparatus
- 专利标题(中): 光子测量方法和装置
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申请号: US13598324申请日: 2012-08-29
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公开(公告)号: US20120323109A1公开(公告)日: 2012-12-20
- 发明人: John F. Heanue , Joseph A. Heanue , Brian P. Wilfley , Augustus P. Lowell
- 申请人: John F. Heanue , Joseph A. Heanue , Brian P. Wilfley , Augustus P. Lowell
- 申请人地址: US CO Boulder
- 专利权人: NELLCOR PURITAN BENNETT LLC
- 当前专利权人: NELLCOR PURITAN BENNETT LLC
- 当前专利权人地址: US CO Boulder
- 主分类号: A61B6/00
- IPC分类号: A61B6/00
摘要:
A system and method for measuring photons utilizing a low-power light source modulated with a code sequence to interrogate a sample of interest. Preferably a portion of the scattered light from the sample is detected by a photo-detector. A correlation of the photo-detector signal and the code sequence produces an estimate of the distribution of flight times for photons traveling from the source to the detector.
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