发明申请
- 专利标题: Detection System for Birefringence Measurement
- 专利标题(中): 双折射测量检测系统
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申请号: US13588352申请日: 2012-08-17
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公开(公告)号: US20120326005A1公开(公告)日: 2012-12-27
- 发明人: Baoliang WANG
- 申请人: Baoliang WANG
- 申请人地址: US OR Hillsboro
- 专利权人: HINDS INSTRUMENTS, INC.
- 当前专利权人: HINDS INSTRUMENTS, INC.
- 当前专利权人地址: US OR Hillsboro
- 主分类号: G01J1/16
- IPC分类号: G01J1/16
摘要:
A system for controlling a light beam in an optical setup includes a light source that directs a collimated light beam along a path, through a sample, and toward the active area of a stationary detector. A lens is selectively movable into the path of the light beam for spreading the beam in instances where the path of the beam is altered by the sample between the source and the stationary detector. The detector, therefore, is held stationary. Adjustment mechanisms are provided for increasing the intensity characteristic of the light that reaches the detector to account for a decrease in intensity that occurs when the lens is in the path of the light beam to spread the beam.
公开/授权文献
- US08520207B2 Detection system for birefringence measurement 公开/授权日:2013-08-27
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