发明申请
- 专利标题: METHOD AND SYSTEM FOR SCATTER CORRECTION IN X-RAY IMAGING
- 专利标题(中): X射线成像中散射校正的方法和系统
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申请号: US13174480申请日: 2011-06-30
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公开(公告)号: US20130004050A1公开(公告)日: 2013-01-03
- 发明人: Xiaoye Wu , Jiang Hsieh , Paavana Sainath , Xin Liu
- 申请人: Xiaoye Wu , Jiang Hsieh , Paavana Sainath , Xin Liu
- 申请人地址: US NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Schenectady
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
Approaches for deriving scatter information using inverse tracking of scattered X-rays is disclosed. In certain embodiments scattered rays are tracked from respective locations on a detector to a source of the X-ray radiation, as opposed to tracking schemes that proceed from the source to the detector. In one such approach, the inverse tracking is implemented using a density integrated volume that reduces the integration steps performed.
公开/授权文献
- US08483471B2 Method and system for scatter correction in X-ray imaging 公开/授权日:2013-07-09
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