发明申请
US20130004050A1 METHOD AND SYSTEM FOR SCATTER CORRECTION IN X-RAY IMAGING 有权
X射线成像中散射校正的方法和系统

METHOD AND SYSTEM FOR SCATTER CORRECTION IN X-RAY IMAGING
摘要:
Approaches for deriving scatter information using inverse tracking of scattered X-rays is disclosed. In certain embodiments scattered rays are tracked from respective locations on a detector to a source of the X-ray radiation, as opposed to tracking schemes that proceed from the source to the detector. In one such approach, the inverse tracking is implemented using a density integrated volume that reduces the integration steps performed.
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