发明申请
- 专利标题: SYSTEM AND METHOD FOR MEASUREMENT AIDED PREDICTION OF TEMPERATURE AND AIRFLOW VALUES IN A DATA CENTER
- 专利标题(中): 用于测量数据中心温度和气流值的测量系统和方法
-
申请号: US13171152申请日: 2011-06-28
-
公开(公告)号: US20130006426A1公开(公告)日: 2013-01-03
- 发明人: Christopher Healey , Xuanhang Zhang , James W. VanGilder
- 申请人: Christopher Healey , Xuanhang Zhang , James W. VanGilder
- 主分类号: G05D23/19
- IPC分类号: G05D23/19 ; G06G7/57 ; G06G7/56
摘要:
A system and method for evaluating cooling performance of equipment in a data center, the equipment including a plurality of equipment racks and at least one cooling provider. In one aspect, a method includes receiving a plurality of measured inlet and exhaust air temperature values for the at least one cooling provider and a subset of the plurality of equipment racks, implementing a cooling model, the model including an ambient air temperature value, a plurality of inlet and exhaust air temperature values for the plurality of equipment racks and the at least one cooling provider, and a plurality of airflow values for the plurality of equipment racks and the at least one cooling provider, adjusting at least one of the ambient air temperature value and each of the plurality of airflow values in the cooling model, adjusting the cooling model to compensate for the adjusted at least one of the ambient air temperature value and each of the plurality of airflow values in the cooling model, substituting a first subset of the plurality of inlet and exhaust air temperature values in the cooling model with the plurality of measured inlet and exhaust air temperature values, and predicting a second subset of the plurality of inlet and exhaust air temperature values for the plurality of equipment racks and the at least one cooling provider in the cooling model.
公开/授权文献
信息查询