Invention Application
- Patent Title: Inertial Measurement Systems, and Methods of Use and Manufacture Thereof
- Patent Title (中): 惯性测量系统及其使用和制造方法
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Application No.: US13194574Application Date: 2011-07-29
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Publication No.: US20130025369A1Publication Date: 2013-01-31
- Inventor: Matthew S. Bottkol , Richard D. Elliott , Michael Y. Feng , Thomas F. Marinis , Michael F. McManus , Shan Mohiuddin , Peter G. Sherman , John E. Pritchett , Jeffery W. Warren , Charles H. Lange
- Applicant: Matthew S. Bottkol , Richard D. Elliott , Michael Y. Feng , Thomas F. Marinis , Michael F. McManus , Shan Mohiuddin , Peter G. Sherman , John E. Pritchett , Jeffery W. Warren , Charles H. Lange
- Main IPC: G01P15/08
- IPC: G01P15/08 ; H05K3/30
Abstract:
A micro-electro-mechanical systems (MEMS) inertial measurement system facilitates accurate location and/or attitude measurements via passive thermal management of MEMS inertial sensors. Accuracy of the system is also improved by subjecting the inertial sensors to programmed single-axis gimbal motion, and by performing coarse and fine adjustments to the attitude estimates obtained by the system based on the programmed motion and on the passive thermal management of the sensors.
Public/Granted literature
- US08978474B2 Inertial measurement systems, and methods of use and manufacture thereof Public/Granted day:2015-03-17
Information query
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