发明申请
- 专利标题: ECCENTRICITY MEASURING METHOD
- 专利标题(中): 偏心测量方法
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申请号: US13640709申请日: 2011-04-05
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公开(公告)号: US20130027692A1公开(公告)日: 2013-01-31
- 发明人: Kazuyuki Ogura , Masahiro Okitsu , Youichi Ogawa , Kyu Takada
- 申请人: Kazuyuki Ogura , Masahiro Okitsu , Youichi Ogawa , Kyu Takada
- 优先权: JP2010-092057 20100413
- 国际申请: PCT/JP2011/002018 WO 20110405
- 主分类号: G01B11/14
- IPC分类号: G01B11/14
摘要:
In an eccentricity measuring method according to the present invention, a first position of a light source image formed by reflection at one optical surface is measured (S2), a predetermined second position related to another optical surface is measured (S3), and a relative eccentricity between both optical surfaces is calculated based on the first and second positions (S5). Therefore, the eccentricity measuring method enables measurement of eccentricity by a same measurement optical system regardless of a radius of curvature of an optical surface of an optical element.
公开/授权文献
- US08665425B2 Eccentricity measuring method 公开/授权日:2014-03-04
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