发明申请
- 专利标题: TEST DEVICE FOR PRINTED CIRCUIT BOARD
- 专利标题(中): 印刷电路板测试装置
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申请号: US13271247申请日: 2011-10-12
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公开(公告)号: US20130043896A1公开(公告)日: 2013-02-21
- 发明人: JIAN-CHUN PAN , HAI-QING ZHOU , YI-XIN TU
- 申请人: JIAN-CHUN PAN , HAI-QING ZHOU , YI-XIN TU
- 申请人地址: TW Tu-Cheng CN Shenzhen City
- 专利权人: HON HAI PRECISION INDUSTRY CO., LTD.,HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
- 当前专利权人: HON HAI PRECISION INDUSTRY CO., LTD.,HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
- 当前专利权人地址: TW Tu-Cheng CN Shenzhen City
- 优先权: CN201110237576.6 20110818
- 主分类号: G01R31/00
- IPC分类号: G01R31/00
摘要:
A test device for testing a printed circuit board (PCB) includes a base and a measuring device. The measuring device includes a testing pin and is capable of measuring any desired point of the PCB on condition that the pin makes contact with the point at an included angle between the pin and a back surface of the PCB which is larger than a predetermined angle. The distance between the base and the PCB satisfies: H>L tan θ, where H is the vertical distance between the PCB and the base, L is the maximum length of an orthogonal projection of the pin on the PCB when the pin is contacting the point, and θ is the predetermined angle.
公开/授权文献
- US08736293B2 Test device for printed circuit board 公开/授权日:2014-05-27
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