发明申请
US20130049999A1 ANALOG/DIGITAL CONVERTER AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
有权
模拟/数字转换器和半导体集成电路器件
- 专利标题: ANALOG/DIGITAL CONVERTER AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- 专利标题(中): 模拟/数字转换器和半导体集成电路器件
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申请号: US13338338申请日: 2011-12-28
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公开(公告)号: US20130049999A1公开(公告)日: 2013-02-28
- 发明人: TAKASHI OSHIMA , Taizo Yamawaki , Tomomi Takahashi
- 申请人: TAKASHI OSHIMA , Taizo Yamawaki , Tomomi Takahashi
- 主分类号: H03M1/10
- IPC分类号: H03M1/10
摘要:
A reference A/D conversion unit is connected in parallel to an input common to a time-interleaved A/D converter to be a calibration target, and the output of each unitary A/D conversion unit which makes up the time-interleaved A/D converter is calibrated in a digital region by using a low-speed high-resolution A/D conversion result output from the reference A/D conversion unit. Also, fCLK/N (fCLK represents an overall sampling rate of the time-interleaved A/D converter, and N is relatively prime to the number of unitary A/D conversion units connected in parallel M) is set as the operation clock frequency of the reference A/D conversion unit. Samplings of all unitary A/D conversion units can be sequentially synchronized with the sampling of the reference A/D conversion unit, and the operation clock frequency of the reference A/D converter can be made N times slower than the overall sampling rate of the time-interleaved A/D converter.