发明申请
- 专利标题: MOLD THERMOPHYSICAL PROPERTIES FOR THICKNESS UNIFORMITY OPTIMIZATION OF EXOCAST SHEET
- 专利标题(中): 模具厚度均匀性优化的热塑性物理特性
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申请号: US13214366申请日: 2011-08-22
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公开(公告)号: US20130052802A1公开(公告)日: 2013-02-28
- 发明人: Glen Bennett Cook , Prantik Mazumder , Balram Suman
- 申请人: Glen Bennett Cook , Prantik Mazumder , Balram Suman
- 主分类号: H01L21/20
- IPC分类号: H01L21/20 ; B29C33/38
摘要:
The disclosure relates to substrate molds with variable thermal mass. The disclosure relates to substrate molds comprising refractory materials having a leading edge and a trailing edge, wherein the substrate mold has a graded thermal mass comprising a leading edge thermal mass (Mt(lead)) and a trailing edge thermal mass (Mt(trail)), wherein Mt(lead) is less than Mt(trail). The disclosure also relates to methods of making articles of semiconducting material and methods of minimizing total thickness variation in articles of semiconducting material, said methods comprising using the molds disclosed.