发明申请
US20130055179A1 COMPUTING VALIDATION COVERAGE OF INTEGRATED CIRCUIT MODEL 失效
集成电路模型的计算验证覆盖

COMPUTING VALIDATION COVERAGE OF INTEGRATED CIRCUIT MODEL
摘要:
Embodiments of the present invention provide a method of computing validation coverage of an integrated circuit model, comprising: obtaining a logical structure of a integrated circuit model under validation; searching and recording signal paths in the integrated circuit model under validation based on the logical structure; and computing coverage of validation with respect to the signal paths. According to the technical solution as provided in the embodiments of the present invention, a signal path-based validation coverage may be obtained, thereby providing data regarding validation completeness more accurately.
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