Described herein are methods, systems and apparatus to improve imaging sensor production yields. In one method, a stereoscopic image sensor pair is provided from a manufacturing line. One or more images of a correction pattern are captured by the image sensor pair. Correction angles of the sensor pair are determined based on the images of the correction pattern. The correction angles of the sensor pair are represented graphically in a three dimensional space. Analysis of the graphical representation of the correction angles through statistical processing results in a set of production correction parameters that may be input into a manufacturing line to improve sensor pair yields.