发明申请
- 专利标题： METHOD OF CALCULATING ACCURACY OF MEASURING LOCATION, AND METHOD AND APPARATUS FOR MEASURING LOCATION OF TERMINAL USING ACCURACY OF MEASURING LOCATION
- 专利标题（中）： 计算测量精度的方法以及使用测量位置精度测量终端位置的方法和装置
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申请号： US13600956申请日： 2012-08-31
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公开(公告)号： US20130080048A1公开(公告)日： 2013-03-28
- 发明人: Eung Sun KIM , Dohyung PARK , Yong KIM
- 申请人： Eung Sun KIM , Dohyung PARK , Yong KIM
- 申请人地址： KR Suwon-si
- 专利权人： SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人： SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址： KR Suwon-si
- 优先权： KR10-2011-0096908 20110926
- 主分类号： G01C21/36
- IPC分类号： G01C21/36
摘要：
A method of calculating an accuracy of measuring a location, and a method and apparatus to measure a location of a terminal using the accuracy of measuring the location, are provided. The method of calculating the accuracy of measuring the location of the terminal includes providing a map corresponding to a location measurement type that is used in the terminal. The method further includes reading, from the map, map information of a predetermined area including the location of the terminal. The method further includes calculating the accuracy of measuring the location with the location measurement type based on the map information.
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