发明申请
- 专利标题: FAST I/O FAILURE DETECTION AND CLUSTER WIDE FAILOVER
- 专利标题(中): 快速I / O故障检测和群集故障
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申请号: US13250823申请日: 2011-09-30
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公开(公告)号: US20130086413A1公开(公告)日: 2013-04-04
- 发明人: Kirubakaran Kaliannan , Venkata Sreenivasa Rao Nagineni
- 申请人: Kirubakaran Kaliannan , Venkata Sreenivasa Rao Nagineni
- 申请人地址: US CA Mountain View
- 专利权人: SYMANTEC CORPORATION
- 当前专利权人: SYMANTEC CORPORATION
- 当前专利权人地址: US CA Mountain View
- 主分类号: G06F11/07
- IPC分类号: G06F11/07
摘要:
A method for fast I/O path failure detection and cluster wide failover. The method includes accessing a distributed computer system having a cluster including a plurality of nodes, and experiencing an I/O path failure for a storage device. An I/O failure message is generated in response to the I/O path failure. A cluster wide I/O failure message broadcast to the plurality of nodes that designates a faulted controller. Upon receiving I/O failure responses from the plurality nodes, an I/O queue message is broadcast to the nodes to cause the nodes to queue I/O through the faulted controller and switch to an alternate controller. Upon receiving I/O queue responses from the plurality nodes, an I/O failover commit message is broadcast to the nodes to cause the nodes to commit to a failure and un-queue their I/O.
公开/授权文献
- US08683258B2 Fast I/O failure detection and cluster wide failover 公开/授权日:2014-03-25
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