发明申请
- 专利标题: SYSTEM TEST APPARATUS
- 专利标题(中): 系统测试装置
-
申请号: US13704490申请日: 2011-03-15
-
公开(公告)号: US20130086425A1公开(公告)日: 2013-04-04
- 发明人: Byoung Ju Choi , Joo Young Seo , Sueng Wan Yang , Jin Yong Lim , Young Su Kim , Jung Suk Oh , Hae Young Kwon , Seung Yeun Jang
- 申请人: Byoung Ju Choi , Joo Young Seo , Sueng Wan Yang , Jin Yong Lim , Young Su Kim , Jung Suk Oh , Hae Young Kwon , Seung Yeun Jang
- 申请人地址: KR Seoul KR Seoul
- 专利权人: KIA MOTORS CORPORATION,HYUNDAI MOTOR COMPANY
- 当前专利权人: KIA MOTORS CORPORATION,HYUNDAI MOTOR COMPANY
- 当前专利权人地址: KR Seoul KR Seoul
- 优先权: KR10-2010-0061455 20100628; KRPCT/KR2010/006068 20100907
- 国际申请: PCT/KR2011/001803 WO 20110315
- 主分类号: G06F11/26
- IPC分类号: G06F11/26
摘要:
The present invention relates to a system test apparatus. The system test apparatus includes an insertion module configured to insert a test agent into a process control block, a hooking module configured to hook a test target to a test code using the test agent when an event related to the test target occurs, a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked, and a logging module configured to store the pieces of test information collected by the scanning module.
公开/授权文献
- US09354996B2 System test apparatus 公开/授权日:2016-05-31
信息查询